A Study on Optical Waveguide Application of Lanthanum III Oxide (LA O ) Thin Film Prepared 2 3 by Sol-gel Method.

Authors

  • A A Akombor Department of Physics, Benue State University, Makurdi.
  • M D Tyona Department of Physics, Benue State University, Makurdi.
  • J SA Adelabu Department of Physics, University of Abuja, Abuja.

DOI:

: https://doi.org/10.46912/napas.16

Keywords:

Lanthanum Oxide, Nanocrystalline, waveguide, X-ray diffractometry, spectroscopy

Abstract

Optogeometric properties of La 2 O 3 (Lanthanum Oxide) thin films prepared by sol-gel technique have been investigated. Characterization was derived by M-line spectroscopy, X-ray diffractometry and waveguide Raman Spectroscopy. M-line spectroscopy measurements revealed a refractive index of 1.592±0.001 on Pyrex substrate for a wavelength of 543.4nm and thin film thickness of 850nm and 1.589±0.001 on silicon wafer and thickness of single layer is between 40 and 60nm. X-ray diffractrometry has shown that the film has monoclinic structure. Waveguide Raman Spectroscopy has revealed a mixture of La 2 O 3 and La 2 O 2 CO 3 (Lanthanum Oxide Carbonate) which are mainly nanocrystalline and polycrystalline respectively. The research has shown that the La 2 O 3 thin films produced can be used as a planar optical waveguide. The results obtained are comparable with the works of other scientists using different measurement techniques.

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Published

2015-12-28

How to Cite

Akombor, A. A., Tyona, M. D., & Adelabu, J. S. (2015). A Study on Optical Waveguide Application of Lanthanum III Oxide (LA O ) Thin Film Prepared 2 3 by Sol-gel Method. NIGERIAN ANNALS OF PURE AND APPLIED SCIENCES, 6, 112–123. https://doi.org/10.46912/napas.16

Issue

Vol. 6 (2015)

Section

Original Article